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Re. A simple test system
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To: "'Tesla List'" <tesla@pupman.com>
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Subject: Re. A simple test system
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From: Tesla List <tesla@stic.net>
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Date: Sat, 14 Mar 1998 18:22:40 -0600
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Approved: tesla@stic.net
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From: Antonio C. M. de Queiroz [SMTP:acmq@compuland.com.br]
Sent: Friday, March 13, 1998 11:09 AM
To: Tesla List
Subject: Re: Re. A simple test system
Gary Lau wrote:
> Is this offered as a means to determine the correct primary tap? I
> thought that a significant portion of the secondary capacitance is due to
> the ion cloud about the discharge terminal, something that could not be
> done at less than full power. Hence, secondary Fres at low power would
> be significantly higher than at full power, and different still for
> breakout vs. non-breakout conditions.
You are right. The tap determined at low-power will work exactly only in single-shot
operation or in low-power machines. But the difference will not be so great,
and the low-power setting is a good starting point.
Antonio Carlos M. de Queiroz
http://www.coe.ufrj.br/~acmq