Re. A simple test system

• To: "'Tesla List'" <tesla-at-pupman-dot-com>
• Subject: Re. A simple test system
• From: Tesla List <tesla-at-stic-dot-net>
• Date: Sat, 14 Mar 1998 18:22:40 -0600
• Approved: tesla-at-stic-dot-net

----------
From:  Antonio C. M. de Queiroz [SMTP:acmq-at-compuland-dot-com.br]
Sent:  Friday, March 13, 1998 11:09 AM
To:  Tesla List
Subject:  Re: Re. A simple test system

Gary Lau wrote:

> Is this offered as a means to determine the correct primary tap?  I
> thought that a significant portion of the secondary capacitance is due to
> the ion cloud about the discharge terminal, something that could not be
> done at less than full power.  Hence, secondary Fres at low power would
> be significantly higher than at full power, and different still for
> breakout vs. non-breakout conditions.

You are right. The tap determined at low-power will work exactly only in single-shot
operation or in low-power machines. But the difference will not be so great,
and the low-power setting is a good starting point. 
 
Antonio Carlos M. de Queiroz
http://www.coe.ufrj.br/~acmq

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