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Re: Breakdown voltage at submillimeter distances?



Original poster: Bert Hickman <bert.hickman@xxxxxxxxxx>

Tesla list wrote:

Original poster: Robert Clark <bobbygc2001@xxxxxxxxx>
 Actually I'm interested in the results at a few
microns. I found this after a web search:
"Under constant atmospheric conditions, it is found
that the breakdown voltage of a uniform field gap may
be expressed in the form:
 V = A*d + B*SQRT(d)   where d is the gap spacing
[i.e., in centimenters - Bob]
 For air under normal conditions:
 A = 24.4kV/cm
 B = 6.29kV/cm^1/2"
 Anyone know if this formula would apply or know a
more accurate formula at the micron scale?

   Bob Clark


Hello Bob,

There are a few recent experimental studies that indicate that, for gap distances of less than ~4-6 microns in air at STP, breakdown voltage diverges from the climbing curve seen in the left half of the Paschen curve. Instead of climbing, breakdown voltage declines for decreasing gaps for gaps smaller than ~4-6 microns (at about the Paschen minimum of 325 volts).

One study (1) shows an approximately linear decline, while another (2) shows a linear ( for gaps of less than <2.5 microns) or a logarithmic decline (gaps between 2.5 to 40 microns). The source of electrons supporting avalanche breakdown is apparently field emission (Fowler-Nordheim tunneling) from the cathode due to the extremely high E-field.

Reference 1 estimates breakdown voltage in the region between 0 - 4 microns as:

Vb = K1*d

where K1 is between 65 and 110 V/micron and d is in microns.


Reference 2 estimates breakdown (for gaps greater than 2.5 microns) as:

Vb = 120*ln(d) + 62  (for 2.5 < d < 40 microns)

and

Vb ~ 70*d (for d <= 2.5 microns

Reference 3 showed variations in the breakdown voltage curve depending on electrode material (the study used nickel, brass, iron, copper, and aluminum electrodes).

The references are:
1. Slade, P.G.; Taylor, E.D., "Electrical breakdown in atmospheric air between closely spaced (0.2 μm-40 μm) electrical contacts", Electrical Contacts, 2001. Proceedings of the Forty-Seventh IEEE Holm Conference on Publication Date: 10-12 Sept. 2001, Pages 245 - 250. Shows fairly linear decline for 5 micron gaps or less.

2. Lee, R. T.; Chung, H. H.; Chiou, Y. C., "Arc erosion behaviour of silver electric contacts in a single arc discharge across a static gap", Science, Measurement and Technology, IEE Proceedings, Jan 2001, Volume 148, Issue 1, pages 8-14

3. J-M Torres and R S Dhariwal, "Electric field breakdown at micrometre separations", Nanotechnology, 1999, Vol 10 102-107

Bert
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